A Reference-Free Image Index to Simultaneously Quantify Infrared-Imaging Fixed-Pattern-Noise and Blur Artifacts
A reference-free image Applique Pins index to jointly assess infrared-imaging fixed-pattern-noise and blur artifacts is proposed in this work.The proposed index is based on tuned-spatial-domain filtering, which works by combining two Laplace operators to simultaneously quantify the global infrared-imaging fixed-pattern-noise and the global or local